← MySemiconductorBD — Research Discovery Demo
TECHNICAL METHODOLOGY & VERIFICATION SPECIFICATION

MySemiconductorBD: Mathematical Model, Units & Reproducible Benchmarks

Role & Domain Intent: Semiconductor research-discovery demo (Fictional topics, institutions and opportunities; no fab or die-yield calculator.)

1. GOVERNING FORMULATION

Equations, Variables & Dimensional Rules

Fictional semiconductor institutions, research topics and opportunities with reading lists.

Reading Queue Priority = Relevance_Score × Prerequisite_Readiness (evaluated on curated educational topics and local reading notes)

Declared Units: Topic difficulty tiers (Foundational / Intermediate / Advanced); reading list progress in %; local notes in browser JSON.

2. REPRODUCIBLE WORKED EXAMPLE

Step-by-Step Numerical Verification

Research Topic Exploration (CMOS Scaling, Wide-Bandgap Power Devices & Packaging): Learners filter foundational vs. advanced semiconductor topics, inspect dated educational summaries with explicit fictional/illustrative labels on sample institutional directories, and export a structured reading plan without any fabricated fab yield or process-node claims.

Verified benchmark cases from the MySemiconductorBD browser edition
Workspace ModuleContent TypeVerification StatusScope Exclusion
Topic ExplorerVLSI, Power Devices, Packaging primersEducational overviewNot a fab yield or SPICE solver
Reading List & NotesStructured study queue + JSON backupClient-side local storageNo live academic feed
Sample DirectoryFictional institution/opportunity cardsExplicitly labeled fictionalNo recruitment or grant service
3. DATA PROVENANCE & OPERATIONAL BOUNDARIES

Validation Status, Scope Exclusions & Disclaimers